Root
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Conference Proceedings
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4th International Conference on Physics and Control (PhysCon 2009)
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Some Problems of Global Optimization for Beam Lines
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Last year's an interest in microprobe beam lines has been increased

sharply. This is explained by wide application region of similar

facilities. The probe forming systems for generation of beams of

nanometer size (so-called nanoprobe) require precise control of the

beam characteristics. The heightened sensibility to control

parameters deviations forces us to survey very careful mathematical

and computer simulation before any manufacture. The nature of such

systems as control systems leads us forming special methods and

technologies for optimal control problem solution. Moreover, here we

owe to realize a searching of a comprehensive set of performance

criteria, makes detailed predictions on beam characteristics,

possible configuration defects and critical elements, and gives

indications for improvement. A path approaching an optimized

configuration can thus be established based on well-defined

quantitative criteria and special mathematical and computer models

for micro- and nanoprobes as control systems. There are discussed

some practical results.

sharply. This is explained by wide application region of similar

facilities. The probe forming systems for generation of beams of

nanometer size (so-called nanoprobe) require precise control of the

beam characteristics. The heightened sensibility to control

parameters deviations forces us to survey very careful mathematical

and computer simulation before any manufacture. The nature of such

systems as control systems leads us forming special methods and

technologies for optimal control problem solution. Moreover, here we

owe to realize a searching of a comprehensive set of performance

criteria, makes detailed predictions on beam characteristics,

possible configuration defects and critical elements, and gives

indications for improvement. A path approaching an optimized

configuration can thus be established based on well-defined

quantitative criteria and special mathematical and computer models

for micro- and nanoprobes as control systems. There are discussed

some practical results.